GP Solar Showcase New Tool For Wafer & Cell Testing
GP Solar GmbH has introduced an
optimized version of the GP STAB-TEST .Pro. This laboratory measuring
instrument was designed especially for the photovoltaics industry for the
examination of solar wafers and cells.
The system includes so-called
"twist" and "4-point-bend" tests to determine why wafers
break in production and avoid future breakage. The test measures the mechanical
stability and load-bearing capability of silicon wafers. The device can also
perform a "pull-test" to check the adhesion strength of the soldered
contacts to the cell. The quality of these soldered contacts can also be
examined along their full length at 90, 135, and 180 degrees. A further test -
the bow test - measures the bowing of the cells. The data from this test enable
the optimization of the firing process and back-side printing.
The mechanics and electronics in the device have been
completely redesigned, incorporating innovative solutions. The new features
have made the device much easier to use, while at the same time improving the
accuracy of measurements. The various measuring attachments can be switched out
in seconds and, thanks to the new software, automatically adjust to the new
measurement.
Because wafers are becoming ever thinner (<180µm) and
have to last more than 25 years inside a module, ensuring that they can
withstand both processing and a long-term service life is essential.
The new lab tool will be presented at SNEC 2012 PV Power
Expo in Shanghai (May 16-18, 2012).
