New standards include test method for PV silicon feedstock

SEMI has published five new technical standards applicable to the semiconductor, MEMS and photovoltaic (PV) manufacturing industry. The new standards, developed by technical experts from equipment and materials suppliers, device manufacturers and other companies participating in the SEMI International Standards Program, are available for purchase in download and CD-ROM format at www.semi.org. Soon they will be available through a new SEMI standards product called SEMIViews, an online Web 2.0 service enabling access to SEMI International Standards 24/7 from any location.





SEMI Standards are published three times a year. The new standards, part of the March 2009 publication cycle, join more than 780 standards that have been published by SEMI during the past 35 years.



The new standards include a test method for evaluating photovoltaic silicon feedstock. While SEMI has been developing and publishing PV standards since 1981, they were previously included in the materials volume.



“Given the level of current standards development activity in the PV area, SEMI created a new volume focused on photovoltaics,” said James Amano, Director, SEMI International Standards. “The new PV standard, along with the four others announced today, will contribute to improved yield and ensure compatibility of equipment and processes worldwide.”



The list of new SEMI Standards being released includes:





SEMI E151



Guide for Understanding Data Quality



SEMI F107



Guide for Process Equipment Adaptor Plates





SEMI M75



Specifications for Polished Monocrystalline Gallium Antimonide Wafers





SEMI MS8



Guide to Evaluating Hermeticity of MEMS Packages SEMI PV1 Test Method for Measuring Trace Elements in Photovoltaic-Grade Silicon by High-Mass Resolution Glow Discharge Mass Spectrometry